Martinez, A., Svizhenko, A., Anantram, M., Barker, J., Brown, A., Biegel, B. and Asenov, A. (2005) Impact of stray charges on the characteristics of nano-DGMOSFETs in the ballistic regime: A NEGF simulation study. In: Silicon Nanoelectronics Workshop 2005, Kyoto, Japan, pp. 76-77.
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Charge, Impact, Silicon, Simulation, Stray Charges |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Barker, Professor John and Brown, Mr Andrew and Asenov, Professor Asen and Martinez, Dr Antonio |
| Authors: | Martinez, A., Svizhenko, A., Anantram, M., Barker, J., Brown, A., Biegel, B., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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