Monte Carlo simulation of sub-100nm InGaAs MOSFETs for digital applications

Kalna, K., Yang, L. and Asenov, A. (2005) Monte Carlo simulation of sub-100nm InGaAs MOSFETs for digital applications. In: European Solid-State Device Research Conference 2005 - ESSDERC2005, Grenoble, France,

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Item Type:Conference Proceedings
Keywords:Device, Fluctuations, INGAAS, Intrinsic Parameter Fluctuation, Monte Carlo, Monte Carlo Simulation, Monte-Carlo-Simulation, MOSFET, MOSFETS, Parameter Fluctuations, Simulation
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Asenov, Professor Asen and Kalna, Dr Karol
Authors: Kalna, K., Yang, L., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Publisher:IEEE

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