Garcia-Loureiro, A., Kalna, K. and Asenov, A. (2005) New sources of intrinsic parameter fluctuations introduced by a high-k dielectric in sub-100nm Si MOSFETs. In: 18th International Conference on Noise and Fluctuations, Salamanca, Spain, pp. 239-242. ISBN 0-7354-0267-1
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Item Type: | Conference Proceedings |
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Keywords: | Fluctuation, Fluctuations, High-K, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, MOSFET, MOSFETS, Noise, Parameter Fluctuations, Si |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Asenov, Professor Asen and Kalna, Dr Karol |
Authors: | Garcia-Loureiro, A., Kalna, K., and Asenov, A. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Publisher: | American Institute of Physics |
ISBN: | 0-7354-0267-1 |
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