New sources of intrinsic parameter fluctuations introduced by a high-k dielectric in sub-100nm Si MOSFETs

Garcia-Loureiro, A., Kalna, K. and Asenov, A. (2005) New sources of intrinsic parameter fluctuations introduced by a high-k dielectric in sub-100nm Si MOSFETs. In: 18th International Conference on Noise and Fluctuations, Salamanca, Spain, pp. 239-242. ISBN 0-7354-0267-1

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Item Type:Conference Proceedings
Keywords:Fluctuation, Fluctuations, High-K, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, MOSFET, MOSFETS, Noise, Parameter Fluctuations, Si
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Asenov, Professor Asen and Kalna, Dr Karol
Authors: Garcia-Loureiro, A., Kalna, K., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Publisher:American Institute of Physics
ISBN:0-7354-0267-1

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