Barker, JR, Watling, JR, Brown, AR, Roy, S, Zeitzoff, P, Bersuker, G, and Asenov, A (2005) Monte Carlo study of coupled SO phonon-plasmon scattering in Si MOSFETs with high k dielectric gate stacks: hot electron and disorder effects. In: 14th International Conference on Nonequilibrium Carrier Dynamics in Semiconductors - HCIS, Chicago, USA.
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|Item Type:||Conference Proceedings|
|Keywords:||Dynamics, Electron, Gate, High-K, Monte Carlo, MOSFET, MOSFETS, Scattering, Semiconductor, Semiconductors, Si, Stacks|
|Glasgow Author(s):||Barker, Prof John and Brown, Mr Andrew and Watling, Dr Jeremy and Roy, Prof Scott and Asenov, Prof Asen|
|Authors:||Barker, JR, Watling, JR, Brown, AR, Roy, S, Zeitzoff, P, Bersuker, G, and Asenov, A|
|College/School:||College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering|
|Publisher:||IOP PUBLISHING LTD, DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND|