Monte Carlo study of coupled SO phonon-plasmon scattering in Si MOSFETs with high k dielectric gate stacks: hot electron and disorder effects

Barker, J., Watling, J., Brown, A., Roy, S., Zeitzoff, P., Bersuker, G. and Asenov, A. (2005) Monte Carlo study of coupled SO phonon-plasmon scattering in Si MOSFETs with high k dielectric gate stacks: hot electron and disorder effects. In: 14th International Conference on Nonequilibrium Carrier Dynamics in Semiconductors - HCIS, Chicago, USA,

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Item Type:Conference Proceedings
Keywords:Dynamics, Electron, Gate, High-K, Monte Carlo, MOSFET, MOSFETS, Scattering, Semiconductor, Semiconductors, Si, Stacks
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Barker, Professor John and Brown, Mr Andrew and Watling, Dr Jeremy and Roy, Professor Scott and Asenov, Professor Asen
Authors: Barker, J., Watling, J., Brown, A., Roy, S., Zeitzoff, P., Bersuker, G., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Publisher:IOP PUBLISHING LTD, DIRAC HOUSE, TEMPLE BACK, BRISTOL BS1 6BE, ENGLAND

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