Yang, L., Watling, J., Asenov, A. and Barker, J. (2004) Performance degradation due to soft optical phonon scattering in conventional and strained Si MOSFETs with high-k gate dielectrics. In: 34th European Solid-State Device research Conference, ESSDERC, Leuven, Belgium,
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Item Type: | Conference Proceedings |
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Keywords: | Degradation, Device, Dielectrics, Gate, High-K, MOSFET, MOSFETS, Performance, Scattering, Si, Strained Si, Strained-Si |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Barker, Professor John and Watling, Dr Jeremy and Asenov, Professor Asen |
Authors: | Yang, L., Watling, J., Asenov, A., and Barker, J. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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