Riddet, C., Brown, A., Alexander, C., Watling, J., Roy, S. and Asenov, A. (2004) Scattering from body thickness fluctuations in double gate MOSFETs. An ab initio Monte Carlo simulation study. In: International workshop on Computational Electronics, IWCE-10, West Lafayette, USA, pp. 194-195.
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Item Type: | Conference Proceedings |
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Keywords: | Body, Channel, Double Gate MOSFET, Fluctuation, Fluctuations, Gate, Monte Carlo, Monte Carlo Simulation, Monte-Carlo-Simulation, MOSFET, MOSFETS, Propagation, Scattering, Simulation, Thickness, Transport |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Asenov, Professor Asen and Brown, Mr Andrew and Alexander, Dr Craig and Riddet, Mr Craig and Watling, Dr Jeremy and Roy, Professor Scott |
Authors: | Riddet, C., Brown, A., Alexander, C., Watling, J., Roy, S., and Asenov, A. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Publisher: | IEEE |
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