Compact model strategy for studying the impact of intrinsic parameter fluctuations on circuit performance

Cheng, B., Roy, S. and Asenov, A. (2004) Compact model strategy for studying the impact of intrinsic parameter fluctuations on circuit performance. In: 11th International Conference Mixed Design of Integrated Circuits and Systems, Szezecin, Poland, pp. 51-55.

Full text not currently available from Enlighten.


Item Type:Conference Proceedings
Keywords:Circuits, Design, Fluctuation, Fluctuations, Impact, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, Model, Parameter Fluctuations, Performance, System, Systems
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Cheng, Dr Binjie and Roy, Professor Scott and Asenov, Professor Asen
Authors: Cheng, B., Roy, S., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

University Staff: Request a correction | Enlighten Editors: Update this record