Cheng, B., Roy, S. and Adamu-Lema, F. (2004) Impact of intrinsic parameter fluctuations in decanano MOSFETs on yield and functionality of SRAM cells. In: 5th European Workshop on Ultimate Integration of Silicon - ULIS04, Leuven, Belgium, pp. 23-26.
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Item Type: | Conference Proceedings |
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Keywords: | Atomistic, Cells, Decanano MOSFETS, Fluctuation, Fluctuations, Impact, Integration, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, MOSFET, MOSFETS, Parameter Fluctuations, Silicon, Simulation, SRAM |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Cheng, Dr Binjie and Roy, Professor Scott |
Authors: | Cheng, B., Roy, S., and Adamu-Lema, F. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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