Intrinsic parameter fluctuations in conventional MOSFETs at the scaling limit : a statistical study

Adamu-Lema, F., Roy, S., Brown, A., Asenov, A. and Roy, G. (2004) Intrinsic parameter fluctuations in conventional MOSFETs at the scaling limit : a statistical study. In: International workshop on Computational Electronics, IWCE-10, West Lafayette, USA, pp. 44-45.

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Item Type:Conference Proceedings
Keywords:Channel, Fluctuation, Fluctuations, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, Monte Carlo Simulation, Monte-Carlo-Simulation, MOSFET, MOSFETS, N-MOSFETS, Propagation, Scaling, Simulation, Thickness, Transport
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Roy, Dr Gareth and Brown, Mr Andrew and Roy, Professor Scott and Asenov, Professor Asen
Authors: Adamu-Lema, F., Roy, S., Brown, A., Asenov, A., and Roy, G.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Publisher:IEEE

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