Watling, J., Asenov, A., Brown, A., Svizhenko, A. and Anantram, M. (2003) Direct source-to-drain tunneling and its impact on intrinsic parameter fluctuations in nanometre scale double gate MOSFETs. In: Proceedings Modeling and Simulation of Microsystems 2003 - MSM 03, San Francisco, USA,
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Double Gate MOSFET, Fluctuation, Fluctuations, Gate, Impact, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, Microsystem, Microsystems, Modeling, MOSFET, MOSFETS, Parameter Fluctuations, Scale, Simulation |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Brown, Mr Andrew and Watling, Dr Jeremy and Asenov, Professor Asen |
| Authors: | Watling, J., Asenov, A., Brown, A., Svizhenko, A., and Anantram, M. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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