Lee, A., Brown, A., Asenov, A. and Roy, S. (2003) RTS noise simulations of decanano MOSFETs subject to atomic scale structure variations. In: NPMS-6/SIMD-4 Sixth International Conference on New Phenomena in Mesoscopic Systems, and Fourth International Conference on Surfaces and Interfaces of Mesoscopic Devices, Maui, Hawaii, Maui, Hawaii,
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Decanano MOSFETS, Device, Devices, Fluctuation, Fluctuations, Interface, Interfaces, Intrinsic Parameter Fluctuation, Model, MOSFET, MOSFETS, Noise, RTS, Scale, Simulation, Surface, Surfaces, System, Systems |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Asenov, Professor Asen and Brown, Mr Andrew and Roy, Professor Scott |
| Authors: | Lee, A., Brown, A., Asenov, A., and Roy, S. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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