Cheng, B., Roy, S., Roy, G. and Asenov, A. (2003) Integrating 'atomistic' intrinsic parameter fluctuations into compact model circuit analysis. In: ESSDERC 2003 - European Solid-State Device Research Conference, Estoril, Portugal, pp. 437-440.
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Item Type: | Conference Proceedings |
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Keywords: | Atomistic, Device, Fluctuation, Fluctuations, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, Model, Parameter Fluctuations |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Roy, Dr Gareth and Asenov, Professor Asen and Cheng, Dr Binjie and Roy, Professor Scott |
Authors: | Cheng, B., Roy, S., Roy, G., and Asenov, A. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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