Integrating 'atomistic' intrinsic parameter fluctuations into compact model circuit analysis

Cheng, B., Roy, S., Roy, G. and Asenov, A. (2003) Integrating 'atomistic' intrinsic parameter fluctuations into compact model circuit analysis. In: ESSDERC 2003 - European Solid-State Device Research Conference, Estoril, Portugal, pp. 437-440.

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Item Type:Conference Proceedings
Keywords:Atomistic, Device, Fluctuation, Fluctuations, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, Model, Parameter Fluctuations
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Roy, Dr Gareth and Cheng, Dr Binjie and Roy, Professor Scott and Asenov, Professor Asen
Authors: Cheng, B., Roy, S., Roy, G., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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