Brown, A., Adamu-Lema, F. and Asenov, A. (2003) Intrinsic parameter fluctuations in UTB MOSFETs induced by body thickness variations. In: Proceeding Silicon Nanoelectronics Workshop 2003, Kyoto, Japan,
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Body Thickness Variation, Fluctuation, Fluctuations, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, MOSFET, MOSFETS, Parameter Fluctuations, Silicon, Thickness |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Brown, Mr Andrew and Asenov, Professor Asen |
| Authors: | Brown, A., Adamu-Lema, F., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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