Borici, M., Watling, J., Wilkins, R. and Barker, J. (2003) Interface roughness scattering and its impact on electrons transport in relaxed and strained Si- n-MOSFETs. In: 13th International Conference on Nonequilibrium Carrier Dynamics - HCIS 13, Modena, Italy,
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Item Type: | Conference Proceedings |
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Keywords: | Dynamics, Electron, Electrons, Impact, Interface, Interface Roughness, Interface Roughness Scattering, MOSFET, MOSFETS, N-MOSFETS, Scattering, Si, Simulation, Transport |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Barker, Professor John and Watling, Dr Jeremy |
Authors: | Borici, M., Watling, J., Wilkins, R., and Barker, J. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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