Small volume mobility variations due to ionised impurity scattering

Alexander, C., Watling, J. and Asenov, A. (2003) Small volume mobility variations due to ionised impurity scattering. In: 13th International Conference on Nonequilibrium Carrier Dynamics - HCIS 13, Modena, Italy,

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Item Type:Conference Proceedings
Keywords:Dynamics, Electron, Impact, Impurities, Interface Roughness, Mobility, MOSFET, MOSFETS, N-MOSFETS, Scattering, Simulation, Transport
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Alexander, Dr Craig and Watling, Dr Jeremy and Asenov, Professor Asen
Authors: Alexander, C., Watling, J., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering

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