Brown, A., Kaya, S., Asenov, A., Davies, J. and Linton, T. (2001) Statistical 3D simulation of line edge roughness in decanano MOSFETs. In: Silicon Nanoelectronics Workshop, Kyoto, Japan, pp. 10-11.
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Decanano MOSFETS, MOSFET, MOSFETS, Silicon, Simulation |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Brown, Mr Andrew and Asenov, Professor Asen and Davies, Professor John |
| Authors: | Brown, A., Kaya, S., Asenov, A., Davies, J., and Linton, T. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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