Kaya, S., Brown, A., Asenov, A., Margot, D. and Linton, T. (2001) Analysis of statistical fluctuations due to line edge roughness in sub-0.1mm MOSFETs. In: Simulation of Semiconductor Processes and Devices 2001, pp. 78-81.
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Device, Devices, Fluctuation, Fluctuations, MOSFET, MOSFETS, Semiconductor, Simulation |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Brown, Mr Andrew and Asenov, Professor Asen |
| Authors: | Kaya, S., Brown, A., Asenov, A., Margot, D., and Linton, T. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Publisher: | Springer |
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