Yang, L., Watling, J., Wilkins, R., Asenov, A., Barker, J., Roy, S. and Hackbarth, T. (2002) Scaling study of Si/SiGe MOSFETs for RF applications. In: 10th International Symposium on Electron Devices for Microwave and Optoelectronic Devices ( EDMO 2002), Manchester, UK, pp. 101-106.
Full text not currently available from Enlighten.
Item Type: | Conference Proceedings |
---|---|
Additional Information: | IEEE cat no 02TH8629 0-7803-6550-X |
Keywords: | Device, Devices, Electron, Microwave, MOSFET, MOSFETS, Optoelectronic Devices, Scaling, Si/Sige |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Barker, Professor John and Asenov, Professor Asen and Watling, Dr Jeremy and Roy, Professor Scott |
Authors: | Yang, L., Watling, J., Wilkins, R., Asenov, A., Barker, J., Roy, S., and Hackbarth, T. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Publisher: | IEEE |
University Staff: Request a correction | Enlighten Editors: Update this record