Bruls, D., Koenraad, P., Davies, J., Gill, S., Long, F., Hopkinson, M., Skolnick, M., Wolter, J. and Devreese, J. (2003) Direct composition profiling in III-V nanostructures by cross-sectional STM. In: Proceedings of the 26th International Conference on the Physics of Semiconductors, Edinburgh, UK, ISBN 0750309245
Full text not currently available from Enlighten.
| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Composition Profiling, Nanostructures, Semiconductor, Semiconductors |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Davies, Professor John |
| Authors: | Bruls, D., Koenraad, P., Davies, J., Gill, S., Long, F., Hopkinson, M., Skolnick, M., Wolter, J., and Devreese, J. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Publisher: | Institute of Physics |
| ISBN: | 0750309245 |
University Staff: Request a correction | Enlighten Editors: Update this record
Deposit and Record Details
Deposit and Record Details