Direct composition profiling in III-V nanostructures by cross-section STM

Bruls, D., Koenraad, P., Davies, J., Gill, S., Long, F., Hopkinson, M., Skolnick, M., Wolter, J. and Devreese, J. (2002) Direct composition profiling in III-V nanostructures by cross-section STM. In: 26th International Conference on Physics of Semiconductors, Edinburgh, UK, ISBN 0750309245

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Item Type:Conference Proceedings
Keywords:Composition Profiling, Nanostructures, Semiconductor, Semiconductors
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Davies, Professor John
Authors: Bruls, D., Koenraad, P., Davies, J., Gill, S., Long, F., Hopkinson, M., Skolnick, M., Wolter, J., and Devreese, J.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Publisher:Institute of Physics
ISBN:0750309245

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