Scott, J., Longo, P., Holland, M., Stanley, C., Craven, A. and Thayne, I. (2006) Elemental profiling of III-V MOSFET dielectric stacks using scanning transmission electron microscopy with electron energy loss spectroscopy. In: UK III-V Compound Semiconductors 2006, Sheffield, UK,
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Cells, Compound Semiconductor, Dielectric Stacks, Electron, Electron-Microscopy, HEMT, III-V MOSFET, Intermediate Band, Loss, Losses, Microscopy, MOSFET, MOSFETS, Semiconductor, Semiconductors, Solar Cell, Spectroscopy, Stacks, Technology, Transmission |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Thayne, Prof Iain and Stanley, Professor Colin and Holland, Dr Martin |
| Authors: | Scott, J., Longo, P., Holland, M., Stanley, C., Craven, A., and Thayne, I. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Publisher: | IOP/EPSRC |
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