Intrinsic parameter fluctuations in sub-10nm generation UTB SOI MOSFETs

Samsudin, K., Adamu-Lema, F., Brown, A., Roy, S. and Asenov, A. (2006) Intrinsic parameter fluctuations in sub-10nm generation UTB SOI MOSFETs. In: 7 th European Workshop on ULtimate Integration of Silicon, ULIS 2006, Grenoble, France, pp. 93-96. ISBN 88-900874-0-8

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Item Type:Conference Proceedings
Keywords:Fluctuation, Fluctuations, Generation, Integration, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, MOSFET, MOSFETS, Parameter Fluctuations, Silicon, Soi MOSFETS, Utb Soi, Utb-Soi
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Asenov, Professor Asen and Brown, Mr Andrew and Roy, Professor Scott
Authors: Samsudin, K., Adamu-Lema, F., Brown, A., Roy, S., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
ISBN:88-900874-0-8

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