Roy, S., Cheng, B. and Asenov, A. (2006) Impact of intrinsic parameter fluctuation in nano-CMOS devices on circuits and systems. In: International Topical Workshop on Tera- and Nano- Devices: Physics and Modelling, Aizu-Wakamatsu, Japan, pp. 24-25.
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Circuits, Device, Devices, Fluctuation, Impact, Intrinsic Parameter Fluctuation, System, Systems |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Asenov, Professor Asen and Cheng, Dr Binjie and Roy, Professor Scott |
| Authors: | Roy, S., Cheng, B., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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