Martinez, A., Barker, J.R., Svizhenko, A., Anantram, A. and Asenov, A. (2006) The impact of random dopant aggregation in source and drain in the performance of ballistic DG nano-MOSFETs. In: IEEE 2006 Silicon Nanoelectronics Workshop, Honolulu, p. 133.
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| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Impact, nano-MOSFETS, performance, random dopant, silicon |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Barker, Professor John and Asenov, Professor Asen and Martinez, Dr Antonio |
| Authors: | Martinez, A., Barker, J.R., Svizhenko, A., Anantram, A., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering College of Science and Engineering > School of Engineering |
| Publisher: | IEEE |
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