Martinez, A., Kalna, K., Barker, J. and Asenov, A. (2006) A study of the interface roughness effects in Si-nanowires using a full 3D NEGF approach. In: E-MRS IUMRS ICEM 2006, Nice, France, Symposium.
Full text not currently available from Enlighten.
| Item Type: | Conference Proceedings |
|---|---|
| Keywords: | Devices, Interface, Interface Roughness, Simulation |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Barker, Professor John and Asenov, Professor Asen and Kalna, Dr Karol and Martinez, Dr Antonio |
| Authors: | Martinez, A., Kalna, K., Barker, J., and Asenov, A. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Publisher: | European Materials Research Society |
University Staff: Request a correction | Enlighten Editors: Update this record
Deposit and Record Details
Deposit and Record Details