Elemental mapping of III-V MOSFET structures using energy filtered transmission electron microscopy

Longo, P., Scott, J., Hill, R., Moran, D., Craven, A. and Thayne, I. (2006) Elemental mapping of III-V MOSFET structures using energy filtered transmission electron microscopy. In: UK III-V Compound Semiconductors 2006, Sheffield, UK,

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Item Type:Conference Proceedings
Keywords:Cells, Compound Semiconductor, Electron, Electron-Microscopy, GAAS, HEMT, III-V MOSFET, Intermediate Band, Losses, Microscopy, MOSFET, MOSFETS, Semiconductor, Semiconductors, Solar Cell, Spectroscopy, System, Systems, Technology, Transmission
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Thayne, Professor Iain and Hill, Mr Richard and Moran, Dr David
Authors: Longo, P., Scott, J., Hill, R., Moran, D., Craven, A., and Thayne, I.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Publisher:IOP/EPSRC

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