On the impact of high-k gate stacks on mobility: a Monte Carlo study including coupled SO phonon-plasmon scattering

Ferrari, G., Watling, J., Roy, S., Barker, J., Zeitzoff, P., Bersuker, G. and Asenov, A. (2006) On the impact of high-k gate stacks on mobility: a Monte Carlo study including coupled SO phonon-plasmon scattering. In: 11th International Workshop on Computational Electronics, IWCE 2006, Vienna, Austria, p. 111.

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Item Type:Conference Proceedings
Keywords:Gate, High-K, Impact, Mobility, Model, Monte Carlo, Scattering, Simulation, Stacks
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Barker, Professor John and Watling, Dr Jeremy and Roy, Professor Scott and Asenov, Professor Asen
Authors: Ferrari, G., Watling, J., Roy, S., Barker, J., Zeitzoff, P., Bersuker, G., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Publisher:IEEE

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