The impact of intrinsic parameter fluctuations on decananometer circuits and circuit modelling techniques

Cheng, B., Roy, S. and Asenov, A. (2006) The impact of intrinsic parameter fluctuations on decananometer circuits and circuit modelling techniques. In: Mixed Design of Integrated Circuits and System, MIXDES 2006, Gdynia, Poland, pp. 117-121. ISBN 88-900874-0-8

Full text not currently available from Enlighten.


Item Type:Conference Proceedings
Keywords:Circuits, Decananometer, Design, Fluctuation, Fluctuations, Impact, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, Parameter Fluctuations, System
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Cheng, Dr Binjie and Roy, Professor Scott and Asenov, Professor Asen
Authors: Cheng, B., Roy, S., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Publisher:IEEE
ISBN:88-900874-0-8

University Staff: Request a correction | Enlighten Editors: Update this record