Brown, A., Watling, J. and Asenov, A. (2006) Intrinsic parameter fluctuations due to random grain orientation in the high-k stacks. In: 11th International Workshop on Computational Electronics, IWCE 2006, Vienna, Austria, p. 49.
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Item Type: | Conference Proceedings |
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Keywords: | Fluctuation, Fluctuations, HEMT, High-K, Impact, Interface, Intrinsic Parameter Fluctuation, Intrinsic Parameter Fluctuations, Model, Parameter Fluctuations, Scattering, Simulation, Stacks |
Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Brown, Mr Andrew and Watling, Dr Jeremy and Asenov, Professor Asen |
Authors: | Brown, A., Watling, J., and Asenov, A. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
Publisher: | IEEE |
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