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RF performance of strained Si MODFETs and MOSFETs on "virtual" SiGe substrates: A Monte Carlo study

Roy, S., Asenov, A., Babiker, S., Barker, J.R., and Beaumont, S.P. (1997) RF performance of strained Si MODFETs and MOSFETs on "virtual" SiGe substrates: A Monte Carlo study. In: European Solid-State Device Research Conference, 22-24 September 1997, Stuttgart, Germany.

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Publisher's URL: http://ieeexplore.ieee.org/xpl/RecentCon.jsp?punumber=10057

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Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s):Beaumont, Prof Steven and Roy, Prof Scott and Asenov, Prof Asen
Authors: Roy, S., Asenov, A., Babiker, S., Barker, J.R., and Beaumont, S.P.
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Research Group:Device Modelling Group
Publisher:Institute of Electrical and Electronics Engineers
Copyright Holders:Copyright © 1997 Institute of Electrical and Electronics Engineers
First Published:First published in ESSDERC '97 : proceedings of the 27th European Solid-State Device Research Conference (1997):192-195
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

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