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Quantum corrections to the `atomistic' MOSFET simulation

Asenov, A. (2000) Quantum corrections to the `atomistic' MOSFET simulation. In: 7th International Workshop on Computational Electronics, 22-25 May 2000, Glasgow, UK.

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Publisher's URL: http://dx.doi.org/10.1109/IWCE.2000.869895

Abstract

In this paper we study the influence of the quantum effects in the inversion layer on the parameter fluctuation in decanano MOSFETs. The quantum mechanical effects are incorporated in our previously published 3D 'atomistic' simulation approach using a full 3D implementation of the density gradient formalism. This results in a consistent, fully 3D, quantum mechanical picture which incorporates the vertical inversion layer quantization, lateral confinement effects associated with the current filamentation in the valleys of the potential fluctuation, and tunnelling through the sharp potential barriers associated with individual dopants.

Item Type:Conference Proceedings
Keywords:MOSFET, quantum, simulation
Status:Published
Refereed:Yes
Glasgow Author(s):Asenov, Prof Asen
Authors: Asenov, A.
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Research Group:Device Modelling Group
Publisher:Institute of Electrical and Electronics Engineers
Copyright Holders:Copyright © 2000 Institute of Electrical and Electronics Engineers
First Published:First published in 7th International Workshop on Computational Electronics (2000):66-67
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

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