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RF analysis of aggressively scaled pHEMTs

Kalna, K., Roy, S., Asenov, A., Elgaid, K., and Thayne, I. (2000) RF analysis of aggressively scaled pHEMTs. In: 30th European Solid-State Device Research Conference., 11-13 September 2000, Cork, Ireland.

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Publisher's URL: http://ieeexplore.ieee.org/xpl/RecentCon.jsp?punumber=10059

Abstract

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Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s):Thayne, Prof Iain and Elgaid, Dr Khaled and Roy, Prof Scott and Asenov, Prof Asen and Kalna, Dr Karol
Authors: Kalna, K., Roy, S., Asenov, A., Elgaid, K., and Thayne, I.
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Research Group:Device Modelling Group
Publisher:Institute of Electrical and Electronics Engineers
Copyright Holders:Copyright © 2000 Institute of Electrical and Electronics Engineers
First Published:First published in proceedings of the 30th European Solid-State Device Research Conference (2000):159-159
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

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