Limitations to flat-field correction methods when using an X-ray spectrum

Davidson, D.W., Frojdh, C., OShea, V., Nilsson, H.E. and Rahman, M. (2003) Limitations to flat-field correction methods when using an X-ray spectrum. Nuclear Instruments and Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment, 509, pp. 146-150. (doi:10.1016/S0168-9002(03)01563-8)

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Abstract

Flat-field correction methods are implemented in order to eliminate non-uniformities in X-ray imaging sensors. If the compensation is perfect, then the remaining variations result from noise over the detector area. The efficiency of the compensation is reduced when an object is placed in the beam. A principle cause of this effect is believed to be the spectrum hardening caused by the object. In a normal application the correction factors are calculated for a certain spectrum, meaning that the average of the correction for the individual photon energies are used. If the composition of the spectrum changes the correction factor will also change. In this paper, we present a theory for the sensitivity of the gain constants on X-ray spectra. The theory is supported by experimental data obtained with X-ray spectra and monochromatic X-rays.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:UNSPECIFIED
Authors: Davidson, D.W., Frojdh, C., OShea, V., Nilsson, H.E., and Rahman, M.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Nuclear Instruments and Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
ISSN:0168-9002
ISSN (Online):1872-9576

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