Pey, K., Tung, C., Ranjan, R., Lo, V., MacKenzie, M. and Craven, A. (2007) Nano-characterisation of dielectric breakdown in the various advanced gate stack MOSFETs. International Journal of Nanotechnology, 4, pp. 347-376.
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| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Craven, Professor Alan |
| Authors: | Pey, K., Tung, C., Ranjan, R., Lo, V., MacKenzie, M., and Craven, A. |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | International Journal of Nanotechnology |
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