Addressing phase-curvature in Fourier ptychography

Aidukas, T., Loetgering, L. and Harvey, A. (2022) Addressing phase-curvature in Fourier ptychography. Optics Express, (Accepted for Publication)

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Abstract

In Fourier ptychography, multiple low resolution images are captured and subsequently combined computationally into a high-resolution, large-field of view micrograph. A theoretical image-formation model based on the assumption of plane-wave illumination from various directions is commonly used, to stitch together the captured information into a high synthetic aperture. The underlying far-field (Fraunhofer) diffraction assumption connects the source, sample, and pupil planes by Fourier transforms. While computationally simple, this assumption neglects phase-curvature due to non-planar illumination from point sources as well as phase-curvature from finite-conjugate microscopes (e.g., using a single-lens for image-formation). We describe a simple, efficient, and accurate extension of Fourier ptychography by embedding the effect of phase-curvature into the underlying forward model. With the improved forward model proposed here, quantitative phase reconstruction is possible even for wide fields-of-views and without the need of image segmentation. Lastly, the proposed method is computationally efficient, requiring only two multiplications: prior and following the reconstruction.

Item Type:Articles
Status:Accepted for Publication
Refereed:Yes
Glasgow Author(s) Enlighten ID:Aidukas, Dr Tomas and Harvey, Professor Andy
Authors: Aidukas, T., Loetgering, L., and Harvey, A.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Optics Express
Publisher:Optical Society of America
ISSN:1094-4087
ISSN (Online):1094-4087

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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
190828EPSRC Centre for Doctoral Training in Sensing and MeasurementAndrew HarveyEngineering and Physical Sciences Research Council (EPSRC)EP/L016753/1P&S - Physics & Astronomy