Multi-aperture Fourier ptychographic microscopy, theory and validation

Konda, P. C. , Taylor, J. M. and Harvey, A. R. (2021) Multi-aperture Fourier ptychographic microscopy, theory and validation. Optics and Lasers in Engineering, 138, 106410. (doi: 10.1016/j.optlaseng.2020.106410)

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Abstract

We present a novel microscopy concept, termed Multi-Aperture Fourier ptychographic microscopy (MA-FPM), to enable implementation of parallel detectors in microscopy to increase the space-bandwidth-time product. MA-FPM is a synthetic aperture technique: an array of objectives together with tilt-shift illumination are used to synthesize high-resolution, wide field-of-view images. Here, the phase is recovered using Fourier ptychography (FP) algorithms unlike conventional optical synthetic aperture techniques where holographic measurements are used. In this article we report a proof-of-concept experiment by translating a lens and a detector to positions according to the proposed design and demonstrate high-quality imaging performance despite using nine-fold fewer illumination angles compared to an equivalent FP setup. Calibration procedures and a reconstruction algorithm were developed to address the challenges of multiple imaging systems.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Taylor, Dr Jonathan and Konda, Mr Pavan and Harvey, Professor Andy
Creator Roles:
Konda, P. C.Conceptualization, Methodology, Software, Validation, Formal analysis, Investigation, Data curation, Writing – original draft, Writing – review and editing, Visualization
Taylor, J. M.Conceptualization, Methodology, Writing – original draft, Writing – review and editing, Supervision
Harvey, A. R.Conceptualization, Methodology, Writing – original draft, Writing – review and editing, Visualization, Resources, Supervision, Project administration, Funding acquisition
Authors: Konda, P. C., Taylor, J. M., and Harvey, A. R.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Optics and Lasers in Engineering
Publisher:Elsevier
ISSN:0143-8166
ISSN (Online):1873-0302
Published Online:12 October 2020

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