Fitting of photoluminescence spectra for structural characterisation of high current density resonant tunnelling diodes for THz applications

Cito, M., Kojima, O., Stevens, B. J., Mukai, T. and Hogg, R. A. (2021) Fitting of photoluminescence spectra for structural characterisation of high current density resonant tunnelling diodes for THz applications. In: SPIE OPTO, Online Only, California, United States, 6-12 March 2021, (doi:10.1117/12.2582781)

[img] Text
245639.pdf - Accepted Version

995kB

Abstract

High-resolution X-ray diffraction (HR-XRD), and low-temperature photoluminescence spectroscopy (LT-PL) are used to investigate the structural properties and inhomogeneities of high current density InGaAs/AlAs/InP resonant tunnelling diode (RTD) wafer structures. The non-destructive assessment of these structures is challenging, with structural variables: well and barriers thickness and the well indium molar fraction, in addition to electronic variables such as the band-offsets being functions of strain, growth sequence, etc.. Experimental PL data are compared with simulations allowing the deconvolution of the PL spectra, that includes Type I and Type II transitions broadened by interface fluctuations on length scales smaller and much larger than the exciton. This method provides details of the non-uniformity of the epitaxial material nondestructively.

Item Type:Conference Proceedings
Additional Information:Proceedings SPIE Volume 11685, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XIV: 1168511. This project has received funding from the European Union’s Horizon 2020 research and innovation programme under the Marie Skłodowska-Curie under Grant Agreement No. 765426 (TeraApps).
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Cito, Mr Michele and Hogg, Professor Richard
Authors: Cito, M., Kojima, O., Stevens, B. J., Mukai, T., and Hogg, R. A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Copyright Holders:Copyright © 2021 SPIE
Publisher Policy:Reproduced in accordance with the publisher copyright policy
Related URLs:

University Staff: Request a correction | Enlighten Editors: Update this record