Enhanced Capabilities of the Nano-Electronic Simulation Software (NESS)

Medina Bailon, C., Badami, O., Carrillo-Nunez, H., Dutta, T. , Nagy, D. , Adamu-Lema, F., Georgiev, V. P. and Asenov, A. (2020) Enhanced Capabilities of the Nano-Electronic Simulation Software (NESS). In: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, 23 Sep - 06 Oct 2020, pp. 293-296. ISBN 9781728173542 (doi:10.23919/SISPAD49475.2020.9241594)

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Abstract

The aim of this paper is to present a flexible TCAD platform called Nano-Electronic Simulation Software (NESS) which enables the modelling of contemporary future electronic devices combining different simulation paradigms (with different degrees of complexity) in a unified simulation domain. NESS considers confinement-aware band structures, generates the main sources of variability, and can study their impact using different transport models. In particular, this work focuses on the new modules implemented: Kubo-Greenwood solver, Kinetic Monte Carlo solver, Gate Leakage calculation, and a full-band quantum transport solver in the presence of hole-phonon interactions using a mode-space k⋅p approach in combination with the existing NEGF module.

Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Dutta, Dr Tapas and Carrillo-Nunez, Dr Hamilton and Nagy, Dr Daniel and Asenov, Professor Asen and Medina Bailon, Miss Cristina and Badami, Mr Oves and Georgiev, Dr Vihar and Adamu-Lema, Dr Fikru
Authors: Medina Bailon, C., Badami, O., Carrillo-Nunez, H., Dutta, T., Nagy, D., Adamu-Lema, F., Georgiev, V. P., and Asenov, A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
ISSN:1946-1569
ISBN:9781728173542
Copyright Holders:Copyright © 2020 The Japan Society of Applied Physics
First Published:First published in Proceedings of 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 293-296
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

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