Webster, R.W.H., Craven, A.J., Schaffer, B., McFadzean, S., MacLaren, I. and MacLaren, D.A. (2020) Correction of EELS dispersion non-uniformities for improved chemical shift analysis. Ultramicroscopy, 217, 113069. (doi: 10.1016/j.ultramic.2020.113069)
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Abstract
We outline a simple routine to correct for non-uniformities in the energy dispersion of a post-column electron energy-loss spectrometer for use in scanning transmission electron microscopy. We directly measure the dispersion and its variations by sweeping a spectral feature across the full camera to produce a calibration that can be used to linearize datasets post-acquisition, without the need for reference materials. The improvements are illustrated using core excitation electron energy-loss spectroscopy (EELS) spectra collected from NiO and diamond samples. The calibration is rapid and will be of use in all EELS analysis, particularly in assessments of the chemical states of materials via the chemical shift of core-loss excitations.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Craven, Professor Alan and McFadzean, Dr Sam and Webster, Mr Robert and MacLaren, Professor Donald and MacLaren, Dr Ian |
| Authors: | Webster, R.W.H., Craven, A.J., Schaffer, B., McFadzean, S., MacLaren, I., and MacLaren, D.A. |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Ultramicroscopy |
| Publisher: | Elsevier |
| ISSN: | 0304-3991 |
| ISSN (Online): | 1879-2723 |
| Published Online: | 02 July 2020 |
| Copyright Holders: | Copyright © 2020 The Authors |
| First Published: | First published in Ultramicroscopy 217: 113069 |
| Publisher Policy: | Reproduced under a Creative Commons License |
| Data DOI: | 10.5525/gla.researchdata.1032 |
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