Sinclair, M. , Gallacher, K. , Sorel, M. , Bayley, J. C., McBrearty, E. , Millar, R. W. , Hild, S. and Paul, D. J. (2020) 1.4 million Q factor Si₃N₄ micro-ring resonator at 780 nm wavelength for chip-scale atomic systems. Optics Express, 28(3), pp. 4010-4020. (doi: 10.1364/OE.381224)
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Abstract
A silicon nitride micro-ring resonator with a loaded Q factor of 1.4 × 10⁶ at 780 nm wavelength is demonstrated on silicon substrates. This is due to the low propagation loss waveguides achieved by optimization of waveguide sidewall interactions and top cladding refractive index. Potential applications include laser frequency stabilization allowing for chip-scale atomic systems targeting the ⁸⁷Rb atomic transition at 780.24 nm. The temperature dependent wavelength shift of the micro-ring was determined to be 13.1 pm/K indicating that a minimum temperature stability of less than ±15 mK is required for such devices for wavelength locking applications. If a polyurethane acrylate top cladding of an optimized thickness is used then the micro-ring could effectively be athermal, resulting in reduced footprint, power consumption, and cost of potential devices.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Hild, Professor Stefan and Millar, Dr Ross and Sinclair, Mr Martin and Sorel, Professor Marc and McBrearty, Dr Euan and Paul, Professor Douglas and Bayley, Joseph and Gallacher, Dr Kevin |
| Authors: | Sinclair, M., Gallacher, K., Sorel, M., Bayley, J. C., McBrearty, E., Millar, R. W., Hild, S., and Paul, D. J. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Optics Express |
| Publisher: | Optical Society of America |
| ISSN: | 1094-4087 |
| ISSN (Online): | 1094-4087 |
| Published Online: | 29 January 2020 |
| Copyright Holders: | Copyright © 2020 The Optical Society |
| First Published: | First published in Optics Express 28(3): 4010-4020 |
| Publisher Policy: | Reproduced under a Creative Commons License |
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