Influence of nitrogen dopant source on the structural, photoluminescence and electrical properties of ZnO thin films deposited by pulsed spray pyrolysis

KaniAmuthana, B., Vinotha, S., Vaithinathan, K., Roy, V. A.L. and Thilakan, P. (2019) Influence of nitrogen dopant source on the structural, photoluminescence and electrical properties of ZnO thin films deposited by pulsed spray pyrolysis. Ceramics International, 45(18A), pp. 24324-24330. (doi: 10.1016/j.ceramint.2019.08.147)

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Abstract

The N-doped ZnO thin films have been deposited using pulsed spray pyrolysis from Zinc Acetate (ZA) precursor along with the N dopants of N2 carrier gas (N2 – series) and Ammonium Acetate (AA – series) on glass substrates at the optimized substrate temperature of 300 °C with different spraying pulse intervals. The X-ray powder diffraction studies confirmed the polycrystalline structures with the presence of mixed compressive and tensile strain along ‘a’ and ‘c-axes’ respectively for the N2 doped films and the presence of compressive strain alone along both ‘a’ and ‘c-axes’ for the AA doped films. The XPS analysis revealed that the N2 gas source led to the incorporation of elemental N into the film and the AA source led to the incorporation of both elemental and molecular N into the film. The Micro Raman Analysis confirmed the N-doping and its contributed carrier localization by exhibiting A1(LO) and A1(TO) modes. Photoluminescence studies exhibited the active band gap of ~3.19 eV with additional peaks related to hole traps at ~3 eV and electron traps at ~2.8 eV without exhibiting peaks correspond to oxygen vacancy defects. The Seebeck measurements confirmed the establishment of intrinsic p-type conductivity in both the cases at room temperature (RT) and the films deposited with pure elemental doping from N2 source found exhibiting better p-type conductivity than those films deposited using AA source.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Vellaisamy, Professor Roy
Authors: KaniAmuthana, B., Vinotha, S., Vaithinathan, K., Roy, V. A.L., and Thilakan, P.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:Ceramics International
Publisher:Elsevier
ISSN:0272-8842
ISSN (Online):1873-3956
Published Online:16 August 2019
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