Mansell, R., Petit, D.C.M.C., Fernández-Pacheco, A. , Lavrijsen, R., Lee, J.H. and Cowburn, R.P. (2018) Sputter grown Fe and Fe/Cr multilayers with fourfold magnetic anisotropy on GaAs. IEEE Transactions on Magnetics, 54(1), 2000105. (doi: 10.1109/TMAG.2017.2755584)
|
Text
204486.pdf - Accepted Version 1MB |
Abstract
Thin films of Fe have been epitaxially sputtered on GaAs substrates with native oxide removal prior to the deposition carried out by an Ar ion milling. Films grown at substrate temperatures above 100 °C show well-defined fourfold anisotropies. The onset of epitaxial growth is accompanied by an increase in the surface roughness with growth occurring in a distinct island-like pattern. The Fe layers show significantly reduced moments, which decrease with increasing temperature. Antiferromagnetic coupling between Fe layers with Cr spacers was measured in a multilayer with a Cr thickness of 2.7 nm, around the second antiferromagnetic peak. The magnetic properties of the films are discussed in the context of multilayer storage applications.
| Item Type: | Articles |
|---|---|
| Additional Information: | This work was supported in part by the European Community through the Seventh Framework Program ERC under Contract 247368: 3SPIN and in part by the Netherlands Organization for Scientific Research and Marie Curie Cofund Action under Grant NWO-Rubicon 680-50-1024. |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Fernandez-Pacheco, Dr Amalio |
| Authors: | Mansell, R., Petit, D.C.M.C., Fernández-Pacheco, A., Lavrijsen, R., Lee, J.H., and Cowburn, R.P. |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | IEEE Transactions on Magnetics |
| Publisher: | IEEE |
| ISSN: | 0018-9464 |
| ISSN (Online): | 1941-0069 |
| Published Online: | 04 December 2017 |
| Copyright Holders: | Copyright © 2017 IEEE |
| First Published: | First published in IEEE Transactions on Magnetics 54(1): 2000105 |
| Publisher Policy: | Reproduced in accordance with the publisher copyright policy |
University Staff: Request a correction | Enlighten Editors: Update this record
Altmetric
Altmetric