Fast pixelated detectors in scanning transmission electron microscopy. Part I: data acquisition, live processing and storage

Nord, M., Webster, R. W.H., Paton, K. A. , McVitie, S. , McGrouther, D. , MacLaren, I. and Paterson, G. W. (2020) Fast pixelated detectors in scanning transmission electron microscopy. Part I: data acquisition, live processing and storage. Microscopy and Microanalysis, 26(4), pp. 653-666. (doi: 10.1017/S1431927620001713)

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Abstract

The use of fast pixelated detectors and direct electron detection technology is revolutionising many aspects of scanning transmission electron microscopy (STEM). The widespread adoption of these new technologies is impeded by the technical challenges associated them. These include issues related to hardware control, and the acquisition, real-time processing and visualisation, and storage of data from such detectors. We discuss these problems and present software solutions for them, with a view to making the benefits of new detectors in the context of STEM more accessible. Throughout, we provide examples of the application of the technologies presented, using data from a Medipix3 direct electron detector. Most of our software is available under an open source licence, permitting transparency of the implemented algorithms, and allowing the community to freely use and further improve upon them.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McGrouther, Dr Damien and Paton, Ms Kirsty and Webster, Robert and Paterson, Dr Gary and MacLaren, Dr Ian and McVitie, Professor Stephen and Nord, Dr Magnus
Authors: Nord, M., Webster, R. W.H., Paton, K. A., McVitie, S., McGrouther, D., MacLaren, I., and Paterson, G. W.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Microscopy and Microanalysis
Publisher:Cambridge University Press
ISSN:1431-9276
ISSN (Online):1435-8115
Published Online:06 July 2020
Copyright Holders:Copyright © 2020 Microscopy Society of America
First Published:First published in Microscopy and Microanalysis 26(4): 653-666
Publisher Policy:Reproduced under a Creative Commons License
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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
171131Fast Pixel Detectors: a paradigm shift in STEM imagingIan MacLarenEngineering and Physical Sciences Research Council (EPSRC)EP/M009963/1P&S - Physics & Astronomy
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