Vosti, H., Stant, L. T., Matei, C., Salter, M. J., Li, C. , Ridler, N. M. and Aaen, P. H. (2020) An Interferometric Characterization Technique for Extreme Impedance Microwave Devices. In: 94th ARFTG Microwave Measurement Symposium, San Antonio, TX, USA, 26-29 Jan 2020, ISBN 9781728120577 (doi: 10.1109/ARFTG47584.2020.9071748)
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202520.pdf - Accepted Version 1MB |
Abstract
This paper presents a microwave impedance characterization technique for extreme impedance devices. The method is based on active interferometry and uses a 2-source 4-port vector network analyzer, which allows for a compact and straight-forward implementation. A new calibration algorithm is described that incorporates error terms from two separate three-known-load calibrations. Based on simulated and measured data, the proposed technique shows substantial improvement in obtaining the impedance of two offset-short devices when compared with conventional measurements.
| Item Type: | Conference Proceedings |
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| Additional Information: | This work was funded and supported by the Engineering and Physical Sciences Research Council (EPSRC) grant EP/L02263X/1. |
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Li, Professor Chong |
| Authors: | Vosti, H., Stant, L. T., Matei, C., Salter, M. J., Li, C., Ridler, N. M., and Aaen, P. H. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Research Group: | Microwave and Terahertz Electronics (MaTE) |
| ISBN: | 9781728120577 |
| Copyright Holders: | Copyright © 2020 IEEE |
| Publisher Policy: | Reproduced in accordance with the copyright policy of the publisher |
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