Modeling and Analysis of Auto-tapping AFM

Basso, M., Paoletti, P., Tiribilli, B. and Vassalli, M. (2009) Modeling and Analysis of Auto-tapping AFM. In: 47th IEEE Conference on Decision and Control, Cancun, Mexico, 09-11 Dec 2008, pp. 5188-5193. ISBN 9781424431236 (doi:10.1109/CDC.2008.4739214)

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Abstract

The paper presents a new atomic force microscopy setup where the cantilever gets excited by a positive feedback loop containing a saturation function. The proposed scheme can be easily modeled and analyzed in the frequency domain using harmonic balance techniques. In imaging applications, we show that an additional controller for the saturation threshold can further reduce the topography error. Preliminary results in experiments confirm the effectiveness of this operating mode, providing good topography resolution and removing some of the known drawbacks of standard dynamic setups.

Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Vassalli, Dr Massimo
Authors: Basso, M., Paoletti, P., Tiribilli, B., and Vassalli, M.
College/School:College of Science and Engineering > School of Engineering > Biomedical Engineering
ISSN:0191-2216
ISBN:9781424431236

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