Disclosing and overcoming the trade-off between noise and scanning speed in atomic force microscopy

Torre, B., Basso, M., Tiribilli, B., Paoletti, P. and Vassalli, M. (2013) Disclosing and overcoming the trade-off between noise and scanning speed in atomic force microscopy. Nanotechnology, 24(32), 325104. (doi: 10.1088/0957-4484/24/32/325104) (PMID:23868095)

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Abstract

Traditional dynamic modalities for atomic force microscopy imaging suffer from a stringent trade-off between fast scanning speed, weak interaction forces and accurate topography reconstruction. Finding an effective compromise between these aspects is often challenging, especially for soft biological samples for which stringent requirements hold when imaged in vivo. In this paper the main causes of this undesired trade-off in standard systems are analyzed and the exploitation of the intrinsic dynamics of the cantilever through a nonlinear control strategy is proposed as a method to overcome this limitation. A direct application to imaging of biological samples is reported to validate the results and show the effectiveness of the proposed technique.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Vassalli, Dr Massimo
Authors: Torre, B., Basso, M., Tiribilli, B., Paoletti, P., and Vassalli, M.
College/School:College of Science and Engineering > School of Engineering > Biomedical Engineering
Journal Name:Nanotechnology
Publisher:IOP Publishing
ISSN:0957-4484
ISSN (Online):1361-6528
Published Online:18 July 2013

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