Charge densities from high-resolution synchrotron X-ray diffraction experiments

Mallinson, P.R., Barr, G., Coles, S.J., Row, T.N.G., MacNicol, D.D., Teat, S.J. and Wozniak, K. (2000) Charge densities from high-resolution synchrotron X-ray diffraction experiments. Journal of Synchrotron Radiation, 7(3), pp. 160-166. (doi: 10.1107/S0909049500002958)

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Publisher's URL: http://dx.doi.org/10.1107/S0909049500002958

Abstract

The combination of intense X-ray sources, especially synchrotron radiation, with area-detector technology has accomplished an enormous advance in the experimental conditions available for charge-density analysis by single-crystal high- resolution X-ray diffraction. Such experiments can now be carried out in a time measured in hours rather than weeks. Some features of these experiments are examined and preliminary results are reported for charge-density studies of 2-hydroxy-5- nitrobenzaldehyde N-cyclohexylimine (1), octakis(m- tolylthio)naphthalene (2), and 7-fluoro-4-styrylcoumarin (3). Weak interactions in crystals of (1) and (3) are found to have similar charge-density characteristics. Cages in the crystal lattice of (2) have a complex charge distribution.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Mallinson, Dr P and MacNicol, Dr David
Authors: Mallinson, P.R., Barr, G., Coles, S.J., Row, T.N.G., MacNicol, D.D., Teat, S.J., and Wozniak, K.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Chemistry
Journal Name:Journal of Synchrotron Radiation
ISSN:0909-0495

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