Chemical and structural characterisation of DGEBA-based epoxies by time of flight secondary ion mass spectrometry (ToF-SIMS) as a preliminary to polymer interphase characterisation

Passlack, S., Brodyanski, A., Bock, W., Kopnarski, M., Presser, M., Geiss, P. L., Possart, G. and Steinmann, P. (2009) Chemical and structural characterisation of DGEBA-based epoxies by time of flight secondary ion mass spectrometry (ToF-SIMS) as a preliminary to polymer interphase characterisation. Analytical and Bioanalytical Chemistry, 393(8), pp. 1879-1888. (doi: 10.1007/s00216-009-2639-6) (PMID:19214485)

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Abstract

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has become a powerful tool in the field of surface analysis since it provides information about the top few monolayers of a sample, i.e. on the chemical composition of the sample surface. Thus, the general question arises whether a surface-sensitive technique like ToF-SIMS would be appropriate to detect systematic chemical and/or structural changes in organic bulk polymers caused by varying a chemical content of the initial components or by tracking, e.g. curing processes in such materials. It is shown that careful sample preparation and the use of multivariate methods permit the quantitative acquisition of chemical and structural information about bulk polymers from the secondary ion signals. The hardener concentration and a cross-linking coefficient in diglycidyl ether of bisphenol A based epoxies were determined by ToF-SIMS measurements on samples with different resin to hardener ratio and varying curing time. In future work, we will use the developed method to investigate the local composition of adhesively bonded joints. In particular, the mapping of the chemical and structural properties in the so-called interphase will then be of interest.

Item Type:Articles
Additional Information:Financial support by the German Research Foundation within the collaborative project PAK 108 (GE 1661/2-1, KO 1220/8-1 and STE 544/27-1) is gratefully acknowledged.
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Steinmann, Professor Paul
Authors: Passlack, S., Brodyanski, A., Bock, W., Kopnarski, M., Presser, M., Geiss, P. L., Possart, G., and Steinmann, P.
College/School:College of Science and Engineering > School of Engineering > Infrastructure and Environment
Journal Name:Analytical and Bioanalytical Chemistry
Publisher:Springer
ISSN:1618-2642
ISSN (Online):1618-2650
Published Online:12 February 2009

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