Terahertz emission from silicon-germanium quantum cascades

Kelsall, R.W. et al. (2003) Terahertz emission from silicon-germanium quantum cascades. In: Pavesi, L., Gaponenko, S. and Dal Negro, L. (eds.) Towards the First Silicon Laser. Series: NATO Science Series (Series II: Mathematics, Physics and Chemistry), 93. Springer Netherlands: Dordrecht, pp. 367-382. ISBN 9781402011948 (doi:10.1007/978-94-010-0149-6_33)

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Whilst most present day efforts towards the realisation of a silicon based laser are focused on the near-infrared (telecommunications) wavelengths, one of the most promising technical approaches is that of a silicon-germanium (SiGe) quantum cascade laser (QCL) operating in the far-infrared or terahertz frequency range. Until recently, the terahertz band (1--10 THz) has proved relatively inaccessible for science and engineering applications since it lies above the present upper frequency limit of millimetre wave electronic based oscillators, and below the range of near and mid-infrared solid state lasers and detectors. However, there is currently a great deal of interest in the development of terahertz technology for imaging and sensing applications: terahertz pulsed imaging has been shown to be capable of detecting caries (the precursor of decay) in human teeth 1, and there are also promising signs that the method could be used to detect basal cell carcinoma (a common form of skin cancer) 2. Many chemical and biological molecules have absorption lines in the THz band, and therefore applications are envisaged in chemical/biological detection and identification. THz imaging is also potentially suitable for baggage/personnel scanning for security applications, where it would provide a low-energy, non-ionising alternative to X-rays.

Item Type:Book Sections
Additional Information:eISBN: 978941001496
Glasgow Author(s) Enlighten ID:Paul, Professor Douglas
Authors: Kelsall, R.W., Ikonic, Z., Harrison, P., Lynch, S.A., Bates, R., Paul, D.J., Norris, D.J., Liew, S.L., Cullis, A.G., Robbins, D.J., Murzyn, P., Pidgeon, C.R., Arnone, D.D., and Soref, R.A.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Research Group:Semiconductor Devices
Publisher:Springer Netherlands

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