Halpin, J.E., Webster, R.W.H., Gardner, H., Moody, M.P., Bagot, P.A.J. and MacLaren, D.A. (2019) An in-situ approach for preparing atom probe tomography specimens by xenon plasma-focused ion beam. Ultramicroscopy, 202, pp. 121-127. (doi: 10.1016/j.ultramic.2019.04.005) (PMID:31005819)
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Abstract
A method for the rapid preparation of atom probe tomography (APT) needles using a xenon plasma-focused ion beam (FIB) instrument is presented and demonstrated on a test sample of Ti-6Al-4V alloy. The method requires significantly less operator input than the standard lift-out protocol, is site-specific and produces needles with minimal ion-beam damage; electron microscopy indicated the needle's surface amorphised/oxidised region to be less than 2 nm thick. The resulting needles were routinely analysable by APT, confirming the expected microstructure and showing negligible Xe contamination.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | MacLaren, Professor Donald and Halpin, Dr John and Webster, Mr Robert |
| Authors: | Halpin, J.E., Webster, R.W.H., Gardner, H., Moody, M.P., Bagot, P.A.J., and MacLaren, D.A. |
| College/School: | College of Science and Engineering > School of Physics and Astronomy |
| Journal Name: | Ultramicroscopy |
| Publisher: | Elsevier |
| ISSN: | 0304-3991 |
| ISSN (Online): | 0304-3991 |
| Published Online: | 12 April 2019 |
| Copyright Holders: | Copyright © 2019 The Authors |
| First Published: | First published in Ultramicroscopy 202:121-127 |
| Publisher Policy: | Reproduced under a Creative Commons license |
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